Synchrotron X-ray diffraction imaging studies of dislocations in Kyropoulos grown Ti doped sapphire crystal

Gourav Sen (1) , Thu Nhi Tran Caliste (2) , Carmen Stelian (1) , Jose Baruchel (2) , Nicolas Barthalay (3) , Thierry Duffar (1)

1 SIMaP - Science et Ingénierie des Matériaux et Procédés
2 ESRF - European Synchrotron Radiation Facility
3 RSA RUBIS DSA

Domaines: Matériaux

Gourav Sen, Thu Nhi Tran Caliste, Carmen Stelian, Jose Baruchel, Nicolas Barthalay, et al.. Synchrotron X-ray diffraction imaging studies of dislocations in Kyropoulos grown Ti doped sapphire crystal. Journal of Crystal Growth, 2017, 468, pp.477 - 483. ⟨10.1016/j.jcrysgro.2016.12.079⟩. ⟨hal-01927324⟩