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Communication Dans Un Congrès Année : 2015

Raman spectroscopy of v-SiO2 under rare gas compression

Coralie Weigel
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Bernard Hehlen
Benoit Ruffle
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Rene Vacher
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Marie Foret
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Résumé

We present accurate measurement of the VV- and VH-polarized Raman spectra of vitreous SiO2 pressurized in the range 0 – 8 GPa in argon or helium atmosphere by means of diamond anvil cell. A fine quantitative analysis of the behavior of the Raman modes in function of pressure is achieved with the help of an old central-force model by Sen and Thorpe describing the dynamics of covalently bonded networks. The model predicts the effect of changes in force constants and bond angles on the vibrational frequencies of the coupled SiO4 tetrahedral network. We show that the pressure shift of the Raman bands cannot be understood without encompassing the variations of both parameters. Investigating two different pressurizing fluids including He which is adsorbed into the silica network, allows revealing the role of each parameter in the compression mechanism of the glass.
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Dates et versions

hal-01909062 , version 1 (30-10-2018)

Identifiants

  • HAL Id : hal-01909062 , version 1

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Coralie Weigel, Bernard Hehlen, Alain Polian, Benoit Ruffle, Rene Vacher, et al.. Raman spectroscopy of v-SiO2 under rare gas compression. Glass & Optical Materials Division Annual Meeting 2015, May 2015, Miami (FL), United States. ⟨hal-01909062⟩
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