New scanning probe microscopy method for near-field imaging of the radiation intensity of semiconductor laser structures

P. A. Alekseev (1) , M. S. Dunaevskiy , A. M. Monahov , A. N. Baranov (2, 3) , Pascal Girard (4) , R. Teissier (2, 3) , A. N. Titkov

1 NRC KI - National Research Center "Kurchatov Institute"
2 IES - Institut d’Electronique et des Systèmes
3 NANOMIR - Composants à Nanostructure pour le moyen infrarouge
4 IMS - Laboratoire de l'intégration, du matériau au système

Domaines: Electronique

P. A. Alekseev, M. S. Dunaevskiy, A. M. Monahov, A. N. Baranov, Pascal Girard, et al.. New scanning probe microscopy method for near-field imaging of the radiation intensity of semiconductor laser structures. Nanostructures: Physics and Technology 22th International Symposium, 2014, St. Petersburg, Russia. ⟨hal-01903499⟩