Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults

Abstract : Over the last few years, many architectures of body or bulk built-in current sensors (BBICSs) have been proposed to detect transient faults (TFs) in integrated circuits, all of them assessed through simulations in which only single TFs affect the circuit under run-time test. This work assesses and demonstrates the ability of a BBICS architecture in also detecting multiple and simultaneous TFs. Based on the classical double-exponential transient current model, multiple fault effects on a case-study circuit have been simulated with the injection of several current sources approximately representing the Gaussian distribution of a laser beam attack. Results show the BBICS architecture is able to detect multiple TFs simultaneously perturbing sensitive nodes of the case-study circuit.
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Article dans une revue
Microelectronics Reliability, Elsevier, 2018, pp.128-134. 〈10.1016/j.microrel.2018.07.111〉
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https://hal.archives-ouvertes.fr/hal-01893676
Contributeur : Laurence Ben Tito <>
Soumis le : jeudi 11 octobre 2018 - 16:07:05
Dernière modification le : vendredi 8 février 2019 - 16:32:08

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Distributed under a Creative Commons Paternité - Pas d'utilisation commerciale 4.0 International License

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Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, et al.. Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults. Microelectronics Reliability, Elsevier, 2018, pp.128-134. 〈10.1016/j.microrel.2018.07.111〉. 〈hal-01893676〉

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