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Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults

Abstract : Over the last few years, many architectures of body or bulk built-in current sensors (BBICSs) have been proposed to detect transient faults (TFs) in integrated circuits, all of them assessed through simulations in which only single TFs affect the circuit under run-time test. This work assesses and demonstrates the ability of a BBICS architecture in also detecting multiple and simultaneous TFs. Based on the classical double-exponential transient current model, multiple fault effects on a case-study circuit have been simulated with the injection of several current sources approximately representing the Gaussian distribution of a laser beam attack. Results show the BBICS architecture is able to detect multiple TFs simultaneously perturbing sensitive nodes of the case-study circuit.
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Contributor : Laurence Ben Tito <>
Submitted on : Thursday, October 11, 2018 - 4:07:05 PM
Last modification on : Tuesday, May 11, 2021 - 11:37:52 AM


Distributed under a Creative Commons Attribution - NonCommercial 4.0 International License



Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, et al.. Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults. Microelectronics Reliability, Elsevier, 2018, 88-90 (29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018)), pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩. ⟨hal-01893676⟩



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