Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults

Raphael Viera (1, 2, 3) , Jean-Max Dutertre (2) , Marie-Lise Flottes (4) , Olivier Potin (5) , Giorgio Di Natale (4) , Bruno Rouzeyre (4) , Rodrigo Possamai Bastos (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 Mines Saint-Étienne MSE - École des Mines de Saint-Étienne
3 SmartIES - Smart Integrated Electronic Systems
4 TEST - Test and dEpendability of microelectronic integrated SysTems
5 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés

Over the last few years, many architectures of body or bulk built-in current sensors (BBICSs) have been proposed to detect transient faults (TFs) in integrated circuits, all of them assessed through simulations in which only single TFs affect the circuit under run-time test. This work assesses and demonstrates the ability of a BBICS architecture in also detecting multiple and simultaneous TFs. Based on the classical double-exponential transient current model, multiple fault effects on a case-study circuit have been simulated with the injection of several current sources approximately representing the Gaussian distribution of a laser beam attack. Results show the BBICS architecture is able to detect multiple TFs simultaneously perturbing sensitive nodes of the case-study circuit.

Domaines: Micro et nanotechnologies/Microélectronique

Raphael Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, et al.. Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults. Microelectronics Reliability, 2018, 88-90, pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩. ⟨hal-01893676⟩