Chipless RFID Tag Discrimination and the Performance of Resemblance Metrics to be used for it

Zeshan Ali (1) , Nicolas Barbot (1) , Romain Siragusa (1) , David Hely (1) , Maxime Bernier (2) , Frédéric Garet (2) , Etienne Perret (1)

1 LCIS - Laboratoire de Conception et d'Intégration des Systèmes
2 IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation

This paper proposes a novel radar based approach for chipless tag discrimination. The proposed technique can be considered as a first step towards chipless authentication of manufactured products. The concept of chipless radiofrequency identification (RFID) is extended to tag discrimination, where each tag produces a unique signature that is very difficult to reproduce even if a clone of the device is made. The proposed technique, using radiofrequency (RF) electromagnetic (EM), keeps non-invasive and non-destructive. This new method to discriminate tag's RF signature is introduced based on the comparison between two resemblance metrics in the frequency domain and time domain. To calculate the resemblance between different signatures entire part of the RF signatures is exploited to utilize the maximum signals' richness. Owing to the chipless RF approach, we show that geometrical variations less than 10 µm (i.e., smaller than λ/1000) can be detected which demonstrate the extreme sensitivity of the method.

Mots clés: Authentication technology; chipless RFID; fabri- cation tolerance; radar approach; randomness

Domaines: Electromagnétisme; Electronique

Zeshan Ali, Nicolas Barbot, Romain Siragusa, David Hely, Maxime Bernier, et al.. Chipless RFID Tag Discrimination and the Performance of Resemblance Metrics to be used for it. IEEE/MTT-S International Microwave Symposium - IMS 2018, Jun 2018, Philadelphia, United States. ⟨10.1109/MWSYM.2018.8439855⟩. ⟨hal-01888533⟩