Processing and analysis of X-ray photoelectron diffraction data using IGOR Pro

Xihui Liang 1 Christophe Lubin 1 Claire Mathieu 1 Nicholas Barrett 1
1 LENSIS - Laboratoire d'Etude des NanoStructures et Imagerie de Surface
SPEC - UMR3680 - Service de physique de l'état condensé, IRAMIS - Institut Rayonnement Matière de Saclay
Abstract : A software package is presented for nearly real-time display of diffractograms during X-ray photoelectron diffraction (XPD) data acquisition and for processing and analysis after an experiment. During the experiment, the package is able to automatically read X-ray photoelectron spectroscopy (XPS) data, perform initial data processing and project intensity values as XPD diffractograms. Four display modes are supported. After the experiment, the package is able to open, process and analyze XPD patterns. The processing functions include rotation, cropping, creating a full 2π pattern using symmetry operations, smoothing and converting a pattern to an image suitable for publication. The analysis functions include displaying polar angles, azimuthal angles, intensity, the core level spectrum at a selected angular data point, and azimuthal and radial profiles. The package also integrates fitting functions for core level spectra. The package is developed using the IGOR Pro scripting language. A graphical user interface has been developed to allow all the operations just by mouse clicking. The package is designed to interface directly with an XPD system at the Saclay center of the French Atomic Energy and Alternative Energies Authority, but the algorithms are generally applicable and can be readily adapted to other XPD systems.
Type de document :
Article dans une revue
Journal of Applied Crystallography, International Union of Crystallography, 2018, 51 (3), pp.935 - 942. 〈10.1107/S1600576718004314〉
Liste complète des métadonnées

https://hal.archives-ouvertes.fr/hal-01872207
Contributeur : Dominique Girard <>
Soumis le : mardi 11 septembre 2018 - 17:07:13
Dernière modification le : jeudi 13 septembre 2018 - 01:10:19

Identifiants

Citation

Xihui Liang, Christophe Lubin, Claire Mathieu, Nicholas Barrett. Processing and analysis of X-ray photoelectron diffraction data using IGOR Pro. Journal of Applied Crystallography, International Union of Crystallography, 2018, 51 (3), pp.935 - 942. 〈10.1107/S1600576718004314〉. 〈hal-01872207〉

Partager

Métriques

Consultations de la notice

42