Time domain reflectometry model : analysis and characterization of a chafing defect in a coaxial cable

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https://hal.archives-ouvertes.fr/hal-01852189
Contributor : Lionel Pichon <>
Submitted on : Wednesday, August 1, 2018 - 9:10:47 AM
Last modification on : Tuesday, May 14, 2019 - 10:39:54 AM

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Abelin Kameni, Florent Loete, Lionel Pichon. Time domain reflectometry model : analysis and characterization of a chafing defect in a coaxial cable. European Physical Journal: Applied Physics, EDP Sciences, 2018, ⟨10.1051/epjap/2018170430⟩. ⟨hal-01852189⟩

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