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Ouvrages Année : 1998

High resolution interferometry (HRI) and electronic speckle pattern interferometry (ESPI) applied to the thermomechanical study of a MOS power transistor

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Physique [physics]

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https://hal.science/hal-01840915

Soumis le : lundi 16 juillet 2018-18:48:45

Dernière modification le : lundi 5 juin 2023-16:52:11

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hal-01840915 , version 1 (16-07-2018)

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  • HAL Id : hal-01840915 , version 1

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K. Nassim, L. Joannes, A. Cornet, Stefan A Dilhaire, Emmanuel Schaub, et al.. High resolution interferometry (HRI) and electronic speckle pattern interferometry (ESPI) applied to the thermomechanical study of a MOS power transistor. pp.227-231, 1998, Therminic: Collection of Papers Presented at the International Worksop on Thermal Investigations of Ics and Microstructures, 2-913329-01-2. ⟨hal-01840915⟩

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