Investigation on the Sensitivity of a 65nm Flash-Based FPGA for CERN Applications

Georgios Tsiligiannis (1, 2) , Rudy Ferraro (3, 2) , Salvatore Danzeca (3) , Alessandro Masi (4) , Markus Brugger (3) , Frédéric Saigné (5, 6)

1 VERIMAG - IMAG - VERIMAG
2 TEST - Test and dEpendability of microelectronic integrated SysTems
3 CERN - European Organization for Nuclear Research
4 CERN [Genève]
5 IES - Institut d’Electronique et des Systèmes
6 RADIAC - Radiations et composants

The continuous need for upgrading the instrumentation and control electronics operating in various CERN experiments and along the LHC accelerator, has driven the qualification process of the new Flash-Based SmartFusion2 FPGAs; a leading candidate to be embedded in future systems. The radiation testing conditions have been chosen to fit the unique CERN environment, while the setup is carefully chosen to qualify all the subcomponents of the SoC FPGA that the engineering teams of CERN are considering for exploitation.

Domaines: Electronique

Georgios Tsiligiannis, Rudy Ferraro, Salvatore Danzeca, Alessandro Masi, Markus Brugger, et al.. Investigation on the Sensitivity of a 65nm Flash-Based FPGA for CERN Applications. RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Brême, Germany. ⟨10.1109/RADECS.2016.8093209⟩. ⟨hal-01824789⟩