The use of a scanning electron microscope as localized micro-beam irradiator

Y. Gonzalez Velo (1) , J. Boch (1, 2) , F. Pichot (1) , J. Mekki (3) , N. Roche , S. Perez , C. Deneau (1) , Frédéric Saigné (1, 2) , L. Dusseau (1, 2) , E. Lorfèvre (4)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 CERN - European Organization for Nuclear Research
4 CNES - Centre National d'Études Spatiales [Toulouse]

Domaines: Electronique

Y. Gonzalez Velo, J. Boch, F. Pichot, J. Mekki, N. Roche, et al.. The use of a scanning electron microscope as localized micro-beam irradiator. 8th European Workshop on Radiation and its Effects on Components and Systems, 2010, Langenfeld, Austria. ⟨hal-01823539⟩