Investigation of the bias effect on total dose induced degradation on bipolar linear microcircuits

Y. Gonzalez Velo (1) , J. Boch (1, 2) , N. Roche , S. Perez (3) , J.-R. Vaillé (1, 2) , L. Dusseau (1, 2) , Frédéric Saigné (1, 2) , E. Lorfèvre (4) , R. D. Schrimpf , C. Chatry , A. Canals

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 CERMAV - Centre de Recherches sur les Macromolécules Végétales
4 CNES - Centre National d'Études Spatiales [Toulouse]

Domaines: Electronique

Y. Gonzalez Velo, J. Boch, N. Roche, S. Perez, J.-R. Vaillé, et al.. Investigation of the bias effect on total dose induced degradation on bipolar linear microcircuits. 10th European Conference on Radiation and its Effects on Components and Systems, 2009, Bruges, Belgium. ⟨hal-01822873⟩