Review and analysis of the radiation induced degradation observed on the input bias current of linear integrated circuits

L. Dusseau (1, 2) , M. Bernard (1, 2) , Y. Gonzalez Velo (1, 2) , N. Roche (1, 2) , E. Lorfèvre (3) , J. Boch (1, 2) , Frédéric Saigné (1, 2)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 CNES - Centre National d'Études Spatiales [Toulouse]

Domaines: Electronique

L. Dusseau, M. Bernard, Y. Gonzalez Velo, N. Roche, E. Lorfèvre, et al.. Review and analysis of the radiation induced degradation observed on the input bias current of linear integrated circuits. 45th IEEE Nuclear Space and Radiation Effects Conference, 2008, Tucson, United States. ⟨hal-01822450⟩