Francisco Massa, Bryan Russell, Mathieu Aubry. Deep exemplar 2d-3d detection by adapting from real to rendered views.
2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Jun 2016, Las Vegas, United States. IEEE, Computer Vision and Pattern Recognition (CVPR), 2016 IEEE Conference on.
〈10.1109/CVPR.2016.648〉.
〈hal-01800639〉