Detection of Minimum Geometrical Variation by Free-Space-Based Chipless Approach and its Application to Authentication

Zeshan Ali (1) , Nicolas Barbot (1) , Romain Siragusa (1) , Etienne Perret (1) , D. Hély (1) , Maxime Bernier (2) , Frédéric Garet (2)

1 LCIS - Laboratoire de Conception et d'Intégration des Systèmes
2 IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation

A free-space-based chipless approach using a second-order bandpass filter model is presented in this letter to detect minimum geometrical variations along the dimensions of a C-folded scatterer. With the help of this model, further randomness inherent in fabrication process can also be analyzed and forecast. Quad C-folded scatterers are used to realize chipless tags and three groups of tags exhibiting distinct arms' length are fabricated. A cosine similarity function is then used to evaluate the similarity rate of electromagnetic signatures reflected by tags coming from different groups. Experimental results performed in a realistic outdoor environment show that it is possible to discriminate two tags which differ from each other by a mean variation of around 25 μm along the arms' length. Finally, the proposed analytical model is capable to dissociate the tags by using merely two extracted aspect-independent quantities: the frequency of resonance and the quality factor.

Mots clés: security applications; authentication; fabrication tolerance; C-folded scatterer; anti-counterfeiting; authentication technology; chipless RFID; microwave; randomness

Domaines: Autre

Zeshan Ali, Nicolas Barbot, Romain Siragusa, Etienne Perret, D. Hély, et al.. Detection of Minimum Geometrical Variation by Free-Space-Based Chipless Approach and its Application to Authentication. IEEE Microwave and Wireless Components Letters, 2018, 28 (4), pp.323 - 325. ⟨10.1109/LMWC.2018.2805858⟩. ⟨hal-01800580⟩