Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

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https://hal.archives-ouvertes.fr/hal-01791002
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Submitted on : Monday, May 14, 2018 - 11:38:15 AM
Last modification on : Friday, June 14, 2019 - 6:31:14 PM

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C. Riedel, R. Arinero, Ph. Tordjeman, M. Ramonda, G. Lévêque, et al.. Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy. Journal of Applied Physics, American Institute of Physics, 2009, 106 (2), ⟨10.1063/1.3182726⟩. ⟨hal-01791002⟩

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