Advanced methods for strain measurement in crystalline nanomaterials: application to multilayer InAlGaP quantum dots formed on high-index (11l)GaAs substrates” - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2018

Advanced methods for strain measurement in crystalline nanomaterials: application to multilayer InAlGaP quantum dots formed on high-index (11l)GaAs substrates”

Fichier non déposé

Dates et versions

hal-01773833 , version 1 (23-04-2018)

Identifiants

  • HAL Id : hal-01773833 , version 1

Citer

Nikolay Cherkashin, V.A. Shchukin, Nikolai N. Ledentsov. Advanced methods for strain measurement in crystalline nanomaterials: application to multilayer InAlGaP quantum dots formed on high-index (11l)GaAs substrates”. XXVII International Materials Research Congress (IMRC 2018), Aug 2018, Cancun, Mexico. ⟨hal-01773833⟩
32 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More