Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

S. Danzeca , P. Peronnard , G. Foucard , G. Tsiligiannis , R. Secondo (1) , R. Ferraro (1) , C.G. Mcallister , T. Borel (1) , M. Brugger , A. Masi , S. Gilardoni

1 IES - Institut d’Electronique et des Systèmes

Vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analyzed. The tested parts include analog, linear, digital, and hybrid devices.

Mots clés: Temperature sensors; Particle beams; MOSFET; Registers; Protons; particle accelerators; radiation hardening (electronics); radiation-induced effects; candidate particle accelerator electronics; particle accelerators electronics; single event effects; total ionizing dose; displacement damage; analog devices; linear devices; digital devices; hybrid devices

Domaines: Physique des accélérateurs [physics.acc-ph]

S. Danzeca, P. Peronnard, G. Foucard, G. Tsiligiannis, R. Secondo, et al.. Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics. 2017 IEEE Radiation Effects Data Workshop, Jul 2017, New Orleans, United States. pp.1-6, ⟨10.1109/NSREC.2017.8115434⟩. ⟨hal-01768145⟩