Analysis of transient electric-field emitted by atom-probe tomography electrode

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https://hal.archives-ouvertes.fr/hal-01765924
Contributor : Etienne Talbot <>
Submitted on : Friday, April 13, 2018 - 11:12:01 AM
Last modification on : Thursday, May 16, 2019 - 1:18:02 PM

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Z. Xu, Y. Liu, B. Ravelo, O. Maurice, L. Zhao, et al.. Analysis of transient electric-field emitted by atom-probe tomography electrode. 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/emceurope.2017.8094618⟩. ⟨hal-01765924⟩

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