V. Nguyen, P. Sabon, J. Chatterjee, L. Tillie, P. Veloso Coelho, et al.. Novel approach for nano-patterning magnetic tunnel junctions stacks at narrow pitch: A route towards high density STT-MRAM applications.
2017 IEEE International Electron Devices Meeting (IEDM), Dec 2017, San Francisco, CA, United States.
⟨10.1109/IEDM.2017.8268517⟩.
⟨hal-01763666⟩