Wall Slip of Soft-Jammed Systems: A Generic Simple Shear Process

X. Zhang 1 Elise Lorenceau 2 Philippe Basset 3 Tarik Bourouina 3 Florence Rouyer 1 Julie Goyon 1 Philippe Coussot 1
1 NAVIER UMR 8205 - Laboratoire Navier
2 LIPhy - Laboratoire Interdisciplinaire de Physique [Saint Martin d’Hères]
3 ESYCOM - Electronique, Systèmes de communication et Microsystèmes
Abstract : From well-controlled long creep tests we show that the residual apparent yield stress observed with soft-jammed systems along smooth surfaces is an artefact due to edge effects. By removing these effects we can determine the stress solely associated with steady state wall slip below the material yield stress. This stress is found to vary linearly with the slip velocity for a wide range of materials whatever the structure, the interaction types between the elements and with the wall, and the concentration. Thus wall slip results from the laminar flow of some given free liquid volume remaining between the (rough) jammed structure formed by the elements, and the smooth wall. This phenomenon may be described by the simple shear flow in a Newtonian liquid layer of uniform thickness. For various systems this equivalent thickness varies in a narrow range (35 ± 15 nm).
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X. Zhang, Elise Lorenceau, Philippe Basset, Tarik Bourouina, Florence Rouyer, et al.. Wall Slip of Soft-Jammed Systems: A Generic Simple Shear Process. Physical Review Letters, American Physical Society, 2017, 119 (20), ⟨10.1103/PhysRevLett.119.208004⟩. ⟨hal-01763648⟩

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