Wall Slip of Soft-Jammed Systems: A Generic Simple Shear Process

X. Zhang 1 Elise Lorenceau 2 Philippe Basset 3 Tarik Bourouina 3 Florence Rouyer 1 Julie Goyon 1 Philippe Coussot 1
1 NAVIER UMR 8205 - Laboratoire Navier
2 LIPhy - Laboratoire Interdisciplinaire de Physique [Saint Martin d’Hères]
3 ESYCOM - Electronique, Systèmes de communication et Microsystèmes
Abstract : From well-controlled long creep tests we show that the residual apparent yield stress observed with soft-jammed systems along smooth surfaces is an artefact due to edge effects. By removing these effects we can determine the stress solely associated with steady state wall slip below the material yield stress. This stress is found to vary linearly with the slip velocity for a wide range of materials whatever the structure, the interaction types between the elements and with the wall, and the concentration. Thus wall slip results from the laminar flow of some given free liquid volume remaining between the (rough) jammed structure formed by the elements, and the smooth wall. This phenomenon may be described by the simple shear flow in a Newtonian liquid layer of uniform thickness. For various systems this equivalent thickness varies in a narrow range (35 ± 15 nm).
Type de document :
Article dans une revue
Physical Review Letters, American Physical Society, 2017, 119 (20), 〈10.1103/PhysRevLett.119.208004〉
Liste complète des métadonnées

Littérature citée [24 références]  Voir  Masquer  Télécharger
https://hal.archives-ouvertes.fr/hal-01763648
Contributeur : Tarik Bourouina <>
Soumis le : jeudi 3 mai 2018 - 18:45:10
Dernière modification le : jeudi 13 septembre 2018 - 15:24:08
Document(s) archivé(s) le : lundi 24 septembre 2018 - 17:21:21

Fichier

Article 5.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

Collections

ENPC | UPEC-UPEM | UGA | IFSTTAR | PARISTECH | LIPHY | UR-NAVIER | ESYCOM | ESIEE-PARIS | UNIV-HESAM

Citation

X. Zhang, Elise Lorenceau, Philippe Basset, Tarik Bourouina, Florence Rouyer, et al.. Wall Slip of Soft-Jammed Systems: A Generic Simple Shear Process. Physical Review Letters, American Physical Society, 2017, 119 (20), 〈10.1103/PhysRevLett.119.208004〉. 〈hal-01763648〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

160

Téléchargements de fichiers

30

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD