Preparation and characterization of Fe-Si-B thin films

M. Satalkar (1) , S. N. Kane (1) , Alexandre Pasko (2) , A. Apolinário , C. T. Sousa , J. Ventura , J. J. Belo , J. M. Teixeira , J. P. Araujo , F. Mazaleyrat (2) , E. Fleury

1 School of Physics
2 SATIE-MME - Matériaux Magnétiques pour l'Energie

Thickness dependence of structural and magnetic properties of Fe 79 Si 8 B 13 films has been studied using magnetic measurements, X-ray diffraction (XRD) and scanning electron microscopy (SEM). Prepared films exhibit the presence of nanocrystalline α-Fe phase embedded in amorphous matrix. Magnetic measurements show their homogeneous nature (within film plane). Direction perpendicular to film plane is the hard direction of magnetization. A cross-sectional SEM measurement provides film thickness. SEM also reveals the granular structure of the films.

Domaines: Science des matériaux [cond-mat.mtrl-sci]

M. Satalkar, S. N. Kane, Alexandre Pasko, A. Apolinário, C. T. Sousa, et al.. Preparation and characterization of Fe-Si-B thin films. 57th DAE Solid State Physics Symposium 2012, Dec 2012, Bombay, Mumbai, India. pp.654-655, ⟨10.1063/1.4791207⟩. ⟨hal-01734917⟩