Generation of high-purity low-temperature samples of K 39 for applications in metrology - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Physical Review A : Atomic, molecular, and optical physics [1990-2015] Année : 2017

Dates et versions

hal-01726734 , version 1 (08-03-2018)

Identifiants

Citer

L. Antoni-Micollier, B. Barrett, L. Chichet, G. Condon, B. Battelier, et al.. Generation of high-purity low-temperature samples of K 39 for applications in metrology. Physical Review A : Atomic, molecular, and optical physics [1990-2015], 2017, 96 (2), ⟨10.1103/PhysRevA.96.023608⟩. ⟨hal-01726734⟩
143 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More