Skip to Main content Skip to Navigation
Journal articles

Radiated Electromagnetic Emission for Integrated Circuit Authentication

Abstract : Counterfeiting of integrated circuit (IC) is a growing concern in the semiconductor industry. Counterfeiting involves economical and safety issues. Both semiconductor companies and embedded system designers are looking for traceability solution in order to get assurance in IC they use. This letter proposes to use Electromagnetic (EM) radiated emission from Integrated Circuits (IC) to create a unique fingerprint for each IC. We have proposed to use a variability-aware circuit configuration which would exploit EM fingerprint for each IC. Our measurement results on two different field-programmable gate array (FPGA) families over several test boards validates this scheme. As a last step, post-processing on the obtained EM measurements is done to get a unique FPGA signature which could be used for the purpose of authentication.
Complete list of metadata

Cited literature [7 references]  Display  Hide  Download
Contributor : David Hely Connect in order to contact the contributor
Submitted on : Wednesday, July 1, 2020 - 3:29:17 PM
Last modification on : Tuesday, November 16, 2021 - 4:12:06 PM
Long-term archiving on: : Wednesday, September 23, 2020 - 4:40:20 PM


C11 Radiated Electromagnetic E...
Files produced by the author(s)





Mosabbah Mushir Ahmed, David Hely, Nicolas Barbot, Romain Siragusa, Etienne Perret, et al.. Radiated Electromagnetic Emission for Integrated Circuit Authentication. IEEE Microwave and Wireless Components Letters, Institute of Electrical and Electronics Engineers, 2017, 27 (11), pp.1028 - 1030. ⟨10.1109/LMWC.2017.2750078⟩. ⟨hal-01724143⟩



Record views


Files downloads