Architectures of Bulk Built-In Current Sensors for Detection of Transient Faults in Integrated Circuits

Rodrigo Possamai Bastos (1) , Leonel Acunha Guimarães (1) , Frank Sill Torres (2) , Laurent Fesquet (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 UFMG - Universidade Federal de Minas Gerais = Federal University of Minas Gerais [Belo Horizonte, Brazil]

Today's integrated circuits are liable to operate under transient faults created either by radiation or malicious sources of perturbation. Among the many techniques for the detection of transient faults, Bulk Built-In Current Sensors (BBICS) present attractive low-cost and efficient features for the protection of circuits. This article provides a survey of published BBICS architectures and compares them with regard to their sensitivities in detecting transient faults. Moreover, a new dynamic BBICS architecture is introduced with improved detection sensitivity, negligible power consumption, and reduced area overhead.

Domaines: Micro et nanotechnologies/Microélectronique

Rodrigo Possamai Bastos, Leonel Acunha Guimarães, Frank Sill Torres, Laurent Fesquet. Architectures of Bulk Built-In Current Sensors for Detection of Transient Faults in Integrated Circuits. Microelectronics Journal, 2017, 71, pp.70-79. ⟨10.1016/j.mejo.2017.11.006⟩. ⟨hal-01721110⟩