Importance of IR Drops on the Modeling of Laser-Induced Transient Faults

Abstract : Laser fault injection attacks induce transient faults by locally generating transient currents capable of temporarily flip the outputs of several gates. Many models used to simulate transient faults induced by laser consider several elements to better represent the effects of the laser on ICs. However, a laser-induced current between VDD and GND, which provokes significant IR drops, has been neglected. This paper highlights the importance of the induced IR drops on the modeling of laser-induced transient faults by using IR drop CAD tools. It also shows that laser-induced IR drops can be sufficiently strong to produce alone transient faults. As a result, the number of faults on a case-study circuit is accentuated whether IR drop effects are taken into account.
Type de document :
Communication dans un congrès
SMACD: Synthesis, Modeling, Analysis and simulation methods and applications to Circuit Design, Jun 2017, Giardini Naxos, Taormina, Italy. IEEE, 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, 2017, 〈10.1109/SMACD.2017.7981593〉
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https://hal.archives-ouvertes.fr/hal-01721087
Contributeur : Laurence Ben Tito <>
Soumis le : jeudi 1 mars 2018 - 16:58:45
Dernière modification le : lundi 7 janvier 2019 - 14:12:05

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Raphael Andreoni Camponogara-Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos. Importance of IR Drops on the Modeling of Laser-Induced Transient Faults. SMACD: Synthesis, Modeling, Analysis and simulation methods and applications to Circuit Design, Jun 2017, Giardini Naxos, Taormina, Italy. IEEE, 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, 2017, 〈10.1109/SMACD.2017.7981593〉. 〈hal-01721087〉

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