Scanning acoustic microscopy and shear wave imaging mode performances for failure detection in high-density microassembling technologies

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Conference papers
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https://hal.archives-ouvertes.fr/hal-01719760
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Submitted on : Wednesday, February 28, 2018 - 2:30:11 PM
Last modification on : Wednesday, August 7, 2019 - 12:18:47 PM

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Z. Remili, Y. Ousten, B. Levrier, E. Suhir, L. Bechou. Scanning acoustic microscopy and shear wave imaging mode performances for failure detection in high-density microassembling technologies. 2015 IEEE 65th Electronic Components and Technology Conference (ECTC), May 2015, San Diego, France. ⟨10.1109/ECTC.2015.7159891⟩. ⟨hal-01719760⟩

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