Ageing Test Results of low voltage MOSFET Modules for Electrical Vehicles

Laurent Dupont (1) , Stéphane Lefebvre (1) , Mounira Bouarroudj (2) , Zoubir Khatir (2) , Jean-Claude Faugieres (1) , Francis Emorine (1)

1 SATIE - Systèmes et Applications des Technologies de l'Information et de l'Energie
2 INRETS/LTN - Laboratoire des Technologies Nouvelles

HEV is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present first results on ageing and failure modes for a 75V/350A MOSFET module from a low voltage / cycled DC current test bench. Bond wires are used for electrical connections between dies and between dies and DCB substrates. For this kind of low voltage and high current module, the main lifetime limitation at high temperature is related to the electric connexions. Automotive Application, High temperature electronics, Hybrid Power Integration, MOSFET, Packaging, Power cycling, Power Semiconductor device, Reliability, test Bench, Thermal Stress.

Mots clés: AUTOMOTIVE APPLICATION; HIGH TEMPERATURE ELECTRONICS; HYBRID POWER INTEGRATION; MOSFET; PACKAGING; POWER CYCLING; POWER SEMICONDUCTOR DEVICE; RELIABILITY; TEST BENCH; THERMAL STRESS

Mots clés: AUTOMATIQUE; HAUTE TEMPERATURE; ELECTRONIQUE; SEMICONDUCTEUR

Domaines: Electronique

Laurent Dupont, Stéphane Lefebvre, Mounira Bouarroudj, Zoubir Khatir, Jean-Claude Faugieres, et al.. Ageing Test Results of low voltage MOSFET Modules for Electrical Vehicles. EPE 2007 - 12th European Conference on Power Electronics and Applications, Sep 2007, Aalborg, Denmark. 10p. ⟨hal-01701952⟩