Criteria to reduce failures induced by EMI conducted on the power supply rails of CMOS operational amplifiers, 2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161), pp.1102-1105, 2001. ,
DOI : 10.1109/ISEMC.2001.950569
Operational amplifier input stage robust to EMI, Electronics Letters, vol.37, issue.15, pp.930-931, 2001. ,
DOI : 10.1049/el:20010651
Towards an EMC roadmap for integrated circuits " ; presented at the Electromagn, Compat. EMC-Compo, 2007. ,
Impact of Temperature on the Electromagnetic Susceptibility of Operational Amplifiers, Progress in Electromagnetics Research Symposium, pp.1063-1065, 2012. ,
Prediction of aging impact on electromagnetic susceptibility of an operational amplifier, 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 2015. ,
DOI : 10.1109/APEMC.2015.7175235
URL : https://hal.archives-ouvertes.fr/hal-01159222
Characterization and model of temperature effect on the conducted immunity of Op-Amp, Microelectronics Reliability, vol.55, issue.9-10, 2015. ,
DOI : 10.1016/j.microrel.2015.06.018
URL : https://hal.archives-ouvertes.fr/hal-01180983
A methodologic project to characterize and model COTS components EMC behavior after ageing, 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 2016. ,
DOI : 10.1109/APEMC.2016.7522742
URL : https://hal.archives-ouvertes.fr/hal-01403877