Multiport ICIM-CI modeling approach applied to a bandgap voltage reference

Siham Hairoud Airieau (1, 2) , Tristan Dubois (2) , Geneviève Duchamp (2) , André Durier (1)

1 IRT Saint Exupéry - Institut de Recherche Technologique
2 IMS - Laboratoire de l'intégration, du matériau au système

This paper presents a modelling approach to build a multiport ICIM-CI model describing the impact of RF disturbances injection through different pins of a micro-power bandgap reference. The component chosen for this study is a commercial one. It combines high accuracy and low drift with low supply current and small package.

Mots clés: EMC/EMI; Immunity measurement; Immunity modelling

Domaines: Energie électrique; Electronique

Siham Hairoud Airieau, Tristan Dubois, Geneviève Duchamp, André Durier. Multiport ICIM-CI modeling approach applied to a bandgap voltage reference. EMC Europe 2016, Sep 2016, Wroclaw, Poland. pp. 526-531. ⟨hal-01688230⟩