Backtracking depth-resolved microstructures for crystal plasticity identification – Part 1: Backtracking microstructures

Abstract : In-situ mechanical tests performed on polycrystalline materials in a scanning electron microscope suffer from the lack of information on depth-resolved 3D microstructures. The latter ones can be accessed with focused ion beam technology only postmortem, because it is destructive. The present study considers the challenge of backtracking this deformed microstructure to the reference state. This theoretical question is tackled on a numerical (synthetic) test case. A 2D microstructure with one dimension along the depth is considered, and deformed using a crystal plasticity law. The proposed numerical strategy is shown to retrieve accurately the reference state.
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JOM Journal of the Minerals, Metals and Materials Society, Springer Verlag (Germany), 2017, 69 (12), pp.2810-2818. 〈10.1007/s11837-017-2585-2〉
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Qiwei Shi, Felix Latourte, François Hild, Stéphane Roux. Backtracking depth-resolved microstructures for crystal plasticity identification – Part 1: Backtracking microstructures. JOM Journal of the Minerals, Metals and Materials Society, Springer Verlag (Germany), 2017, 69 (12), pp.2810-2818. 〈10.1007/s11837-017-2585-2〉. 〈hal-01674542〉

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