Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification

Abstract : The present study considers the identification of crystal plasticity parameters from the knowledge of a deformed microstructure, which has been backtracked to the reference state, and known kinematics along the sample surface. This theoretical question is tackled on a numerical (synthetic) test case. A 2D microstructure with one dimension along the depth is generated, and deformed using known crystal plasticity law. A procedure is proposed to perform the calibration of the constitutive parameters addressing the specific challenge of having a partial knowledge of the boundary conditions. The proposed identification strategy combined with the estimation of the reference microstructure is shown to retrieve the constitutive parameters with good accuracy.
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JOM Journal of the Minerals, Metals and Materials Society, Springer Verlag (Germany), 2017, 69 (12), pp.2803 - 2809. 〈10.1007/s11837-017-2586-1〉
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Qiwei Shi, Felix Latourte, François Hild, Stéphane Roux. Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification. JOM Journal of the Minerals, Metals and Materials Society, Springer Verlag (Germany), 2017, 69 (12), pp.2803 - 2809. 〈10.1007/s11837-017-2586-1〉. 〈hal-01674541〉

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