Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification

Qiwei Shi (1) , Félix Latourte (2) , François Hild (1) , Stéphane Roux (1)

1 LMT - Laboratoire de Mécanique et Technologie
2 EDF R&D - EDF R&D

The present study considers the identification of crystal plasticity parameters from the knowledge of a deformed microstructure, which has been backtracked to the reference state, and known kinematics along the sample surface. This theoretical question is tackled on a numerical (synthetic) test case. A 2D microstructure with one dimension along the depth is generated, and deformed using known crystal plasticity law. A procedure is proposed to perform the calibration of the constitutive parameters addressing the specific challenge of having a partial knowledge of the boundary conditions. The proposed identification strategy combined with the estimation of the reference microstructure is shown to retrieve the constitutive parameters with good accuracy.

Mots clés: Crystal plasticity; finite element model updating; boundary conditions

Domaines: Mécanique des matériaux [physics.class-ph]

Qiwei Shi, Félix Latourte, François Hild, Stéphane Roux. Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification. JOM Journal of the Minerals, Metals and Materials Society, 2017, 69 (12), pp.2803 - 2809. ⟨10.1007/s11837-017-2586-1⟩. ⟨hal-01674541⟩