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Observation of microstructure and damage in materials by phase sensitive radiography and tomography

Abstract : The novel possibilities of phase feature detection in radiography at a third generation synchrotron radiation source are used to image, both in projection and in computed tomography, a cracked silicon single crystal and metal matrix composites strained in tension. Through an instrumentally very simple technique, based on Fresnel diffraction, phase jumps related to the interface between the matrix and the reinforcing phases of the composites are detected even when these phases show very similar x-ray attenuation. Strain-induced cracks with openings below the micrometer range are also visible through the phase modulation they introduce, illustrating the potential of the technique for assessing damage in materials with improved resolution and sensitivity.
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https://hal.archives-ouvertes.fr/hal-01668836
Contributor : Jean-Yves Buffiere <>
Submitted on : Wednesday, December 20, 2017 - 12:07:04 PM
Last modification on : Friday, December 18, 2020 - 1:22:02 PM

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P. Cloetens, M Pateyron‐salomé, Jy Buffiere, G Peix, J Baruchel, et al.. Observation of microstructure and damage in materials by phase sensitive radiography and tomography. Journal of Applied Physics, American Institute of Physics, 1997, 81 (9), pp.5878--5886. ⟨10.1063/1.364374⟩. ⟨hal-01668836⟩

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