A calculation method to estimate single event upset cross section

Frédéric Wrobel (1, 2) , Antoine Touboul (1, 2) , Vincent Pouget (1, 2) , Luigi Dilillo (3) , Jérôme Boch (1, 2) , Frédéric Saigné (1, 2)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 TEST - Test and dEpendability of microelectronic integrated SysTems

Domaines: Electronique

Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Jérôme Boch, et al.. A calculation method to estimate single event upset cross section. Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩. ⟨hal-01636059⟩