Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing

François Forest (1, 2) , Amgad Rashed (1) , Jean-Jacques Huselstein (1, 2) , Thierry Martire (1, 2) , Philippe Enrici (1, 2)

1 IES - Institut d’Electronique et des Systèmes
2 GEM - Groupe énergie et matériaux

Domaines: Electronique

François Forest, Amgad Rashed, Jean-Jacques Huselstein, Thierry Martire, Philippe Enrici. Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing. Microelectronics Reliability, 2015, 55 (1), pp.81 - 92. ⟨10.1016/j.microrel.2014.09.008⟩. ⟨hal-01629261⟩