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Article Dans Une Revue Physical Review Letters Année : 1995

Auger and Coulomb Charging Effects in Semiconductor Nanocrystallites

Résumé

Theoretical and experimental results are presented providing evidence for fast Auger recombination in silicon nanocrystallites. Calculations give nonradiative lifetimes in the 1 ns range. Luminescence experiments on porous silicon exhibit a saturation at high excitation power. The Auger effect gives a natural explanation for this saturation as well as for the recently observed quenching of the photoluminescence and voltage tunable electroluminescence. In this last case the importance of Coulomb charging effects is shown to be at the origin of the linewidth. The consequences of such fast Auger recombination for the optical efficiency of indirect band-gap semiconductor nanocrystallites are discussed.
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hal-01628592 , version 1 (03-11-2017)

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Christophe Delerue, Michel Lannoo, Guy Allan, Évelyne Martin, Irina Mihalcescu, et al.. Auger and Coulomb Charging Effects in Semiconductor Nanocrystallites. Physical Review Letters, 1995, 75 (11), pp.2228 - 2231. ⟨10.1103/PhysRevLett.75.2228⟩. ⟨hal-01628592⟩
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