Automatic Generation Of Self Testing ROM

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Conference papers
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https://hal.archives-ouvertes.fr/hal-01627800
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Submitted on : Thursday, November 2, 2017 - 2:12:15 PM
Last modification on : Thursday, March 21, 2019 - 1:09:46 PM

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  • HAL Id : hal-01627800, version 1

Citation

El Housseine Rejouan, Habib Mehrez. Automatic Generation Of Self Testing ROM. 4th Mixed Design of Integrated Circuits and Systems (MIXDES'1997), Jun 1997, Poznan, Poland. pp.1-5. ⟨hal-01627800⟩

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