Fast myopic 2D-SIM Super Resolution Microscopy with Joint Modulation Pattern Estimation

François Orieux; Vincent Loriette; Jean-Christophe Olivo-Marin; Eduardo Sepulveda; Alexandra Fragola

doi:10.1088/1361-6420/aa8f5b

Fast myopic 2D-SIM Super Resolution Microscopy with Joint Modulation Pattern Estimation

François Orieux ¹ Vincent Loriette ² Jean-Christophe Olivo-Marin ³ Eduardo Sepulveda ² Alexandra Fragola ²

1 L2S - Laboratoire des signaux et systèmes

2 LPEM - Laboratoire de Physique et d'Etude des Matériaux

3 AIQ - Analyse d'Images Quantitative

Document type :

Journal articles

Domain :

Computer Science [cs] / Image Processing

Computer Science [cs] / Signal and Image Processing

Engineering Sciences [physics] / Signal and Image processing

Statistics [stat] / Applications [stat.AP]

Liste complète des métadonnées

https://hal.archives-ouvertes.fr/hal-01623761
Contributor : François Orieux <>
Submitted on : Wednesday, October 25, 2017 - 4:03:51 PM
Last modification on : Thursday, March 21, 2019 - 1:11:21 PM

Fast myopic 2D-SIM Super Resolution Microscopy with Joint Modulation Pattern Estimation

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Fast myopic 2D-SIM Super Resolution Microscopy with Joint Modulation Pattern Estimation

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