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Bernstein specializes in several areas of nano-scale micro-electronic device reliability and physics of failure research, including packaging, system reliability modeling, gate oxide integrity, radiation effects, Flash NAND and NOR memory, SRAM and DRAM, MEMS and laser programmable metal interconnect. He directs the Laboratory for Failure Analysis and Reliability of Electronic Systems, teaches VLSI design courses and heads the VLSI program at Ariel University. His Laboratory is a center of research activity dedicated to serving the needs of manufacturers of highly reliable electronic systems using commercially available off the shelf parts, Professor Bernstein was a Fulbright Senior Researcher ,
Etat in Applied Physics and his field of expertise is on microelectronic parts reliability at Thales Alenia Space He is now full time seconded at Institut de Recherche (IRT) Saint Exupery Toulouse (France) as Technical Referent for microelectronic and photonic components reliability and recognised at Thales Alenia Space as Expert on optics and opto-electronics parts. Dr. Alain Bensoussan interests lie in several areas in microelectronics reliability and physics of failure applied research on GaAs and III-V compounds MMIC (monolithic microwave integrated circuits), microwave hybrid modules, Si and GaN transistors, IC's and Deep-Sub-Micron technologies, MEMS and MOEMS, active and passive optoelectronic devices and modules. He represented Thales Alenia Space at EUROSPACE organization, Aeronautic, Space and Embedded Systems - AESE) Agency -Parts Policy and Standards Working Group) since more than 15 years ,