Abstract : We report the first third order nonlinear characterization of Ge-rich Si 1-x Ge x waveguides, with Germanium concentrations ranging from 0.7 to 0.9. A bi-directional top hat D-Scan method was used to determine the waveguide nonlinear parameters and to deduce the Kerr nonlinear refractive index and the two-photon absorption coefficient at the wavelength of 1.58 µm.
https://hal.archives-ouvertes.fr/hal-01617233
Contributeur : Delphine Marris-Morini
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Soumis le : lundi 16 octobre 2017 - 14:04:13
Dernière modification le : jeudi 7 février 2019 - 16:33:28
Document(s) archivé(s) le : mercredi 17 janvier 2018 - 13:12:31
