Abstract : We report the first third order nonlinear characterization of Ge-rich Si 1-x Ge x waveguides, with Germanium concentrations ranging from 0.7 to 0.9. A bi-directional top hat D-Scan method was used to determine the waveguide nonlinear parameters and to deduce the Kerr nonlinear refractive index and the two-photon absorption coefficient at the wavelength of 1.58 µm.
https://hal.archives-ouvertes.fr/hal-01617233 Contributor : Delphine Marris-MoriniConnect in order to contact the contributor Submitted on : Monday, October 16, 2017 - 2:04:13 PM Last modification on : Friday, January 7, 2022 - 3:45:11 AM Long-term archiving on: : Wednesday, January 17, 2018 - 1:12:31 PM