Direct Insight into Ce-Silicates/Si-Nanoclusters Snowman-Like Janus Nanoparticles Formation in Ce-Doped SiO x Thin Layers

Abstract : The present work reports a nanoscale chemical and structural study on the influence of Ce content in Ce-doped SiO1.5 thin films via atom probe tomography (APT). Using this technique, we can explore 3D mapping of the atomic distribution inside a material. Such an investigation is crucial to optimize the optical properties of Ce-doped SiOx films. As a result, we clearly identify the influence of cerium on the phase separation process, on the silicon nanocrystal growth, and on the formation of cerium silicate nanoparticles occurring during annealing treatments. The observed nanoscale structure is correlated with the optical properties measured by room temperature photoluminescence spectroscopy thus leading to a comprehensive understanding of the properties of Ce-doped SiO1.5 thin films.
Type de document :
Article dans une revue
Journal of Physical Chemistry C, American Chemical Society, 2017, 121 (22), pp.12447 - 12453. 〈10.1021/acs.jpcc.7b03199〉
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https://hal.archives-ouvertes.fr/hal-01611700
Contributeur : Etienne Talbot <>
Soumis le : vendredi 6 octobre 2017 - 12:06:01
Dernière modification le : lundi 1 octobre 2018 - 09:58:07

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Georges Beainy, Jennifer Weimmerskirch-Aubatin, Mathieu Stoffel, Michel Vergnat, Hervé Rinnert, et al.. Direct Insight into Ce-Silicates/Si-Nanoclusters Snowman-Like Janus Nanoparticles Formation in Ce-Doped SiO x Thin Layers. Journal of Physical Chemistry C, American Chemical Society, 2017, 121 (22), pp.12447 - 12453. 〈10.1021/acs.jpcc.7b03199〉. 〈hal-01611700〉

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