Identifying Defects with Guided Algorithms in Bragg Coherent Diffractive Imaging

A. Ulvestad (1) , Y. Nashed , Guillaume Beutier (2) , M. Verdier (2) , S. O. Hruszkewycz (1) , M. Dupraz (3)

1 ANL - Argonne National Laboratory [Lemont]
2 SIMaP - Science et Ingénierie des Matériaux et Procédés
3 PSI - Paul Scherrer Institute

Domaines: Science des matériaux [cond-mat.mtrl-sci]; Cristallographie

A. Ulvestad, Y. Nashed, Guillaume Beutier, M. Verdier, S. O. Hruszkewycz, et al.. Identifying Defects with Guided Algorithms in Bragg Coherent Diffractive Imaging. Scientific Reports, 2017, 7 (1), ⟨10.1038/s41598-017-09582-7⟩. ⟨hal-01611480⟩