Electronic Structure Investigation of Highly Compressed Aluminum with K Edge Absorption Spectroscopy

Abstract : The electronic structure evolution of highly compressed aluminum has been investigated using time resolved $K$ edge x-ray absorption spectroscopy. A long laser pulse (500 ps, I$_L$ $\approx$ 8 X 10$^{13}$ W/cm$^2$) was used to create a uniform shock. A second ps pulse (I$_L$ $\approx$ 10$^{17}$ W/cm$^2$) generated an ultrashort broadband x-ray source near the Al $K$ edge. The main target was designed to probe aluminum at reshocked conditions up to now unexplored (3 times the solid density and temperatures around 8 eV). The hydrodynamical conditions were obtained using rear side visible diagnostics. Data were compared to ${ab}$ ${initio}$ and dense plasma calculations, indicating potential improvements in either description. This comparison shows that x-ray-absorption near-edge structure measurements provide a unique capability to probe matter at these extreme conditions and severally constrains theoretical approaches currently used.
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Physical Review Letters, American Physical Society, 2011, 107, pp.165006
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  • HAL Id : hal-01561859, version 1

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A. Benuzzi-Mounaix, F. Dorchies, V. Recoules, F. Festa, O. Peyrusse, et al.. Electronic Structure Investigation of Highly Compressed Aluminum with K Edge Absorption Spectroscopy. Physical Review Letters, American Physical Society, 2011, 107, pp.165006. 〈hal-01561859〉

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