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Article Dans Une Revue Journal of Applied Crystallography Année : 2017

Introduction to the special issue on high-resolution X-ray diffraction and imaging

Résumé

The 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016) was held in Brno, Czech Republic, in September 2016. It was organized by the Czech and Slovak Crystallographic Association in cooperation with the Masaryk University, Brno, and Charles University, Prague. The Organizing Committee was supported by an International Programme Committee including about 20 prominent scientists from several European and overseas countries, whose helpful suggestions for speakers are acknowledged. The conference was sponsored by the International Union of Crystallography and by several industrial sponsors....
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Dates et versions

hal-01541129 , version 1 (21-06-2017)

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Virginie Chamard, V. Holý. Introduction to the special issue on high-resolution X-ray diffraction and imaging. Journal of Applied Crystallography, 2017, 50, pp.671-672. ⟨10.1107/S1600576717007257⟩. ⟨hal-01541129⟩
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