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Chapitre D'ouvrage Année : 2016

Novel Methods for Bioimaging Including LA-ICP-MS, NanoSIMS, TEM/X-EDS, and SXRF

Résumé

This chapter presents four complementary element-specific bioimaging techniques: laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), nano secondary ion mass spectrometry (NanoSIMS), transmission electron microscopy coupled with energy-dispersive X-ray spectroscopy (TEM/X-EDS), and synchrotron-based X-ray fluorescence (SXRF). LA-ICP-MS is a spatially resolved analytical technique mainly measuring metallic elements in solidmaterials. LA-ICP-MS bioimaging analysis has been applied to cancer studies to investigate metal-ion distribution changes in diseased versus healthy tissues. SIMS is an analytical technique that relies on the sputtering of ions from a solid surface by focused positive or negative primary ion beams and the subsequent analysis of the produced secondary ions by a mass spectrometer under high vacuum. NanoSIMS and TEM/X-EDS are operated under high vacuum where the sample is exposed to a high-energy ion beam or electron beam. These facts demand specific sample preparation strategies for biological samples, which are similar for both techniques and can be regarded together.
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Dates et versions

hal-01529884 , version 1 (31-05-2017)

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  • HAL Id : hal-01529884 , version 1

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Dirk Schaumlöffel, R. Hutchinson, Julien Malherbe, Philippe Le Coustumer, E. Gontier, et al.. Novel Methods for Bioimaging Including LA-ICP-MS, NanoSIMS, TEM/X-EDS, and SXRF. Metallomics Analytical Techniques and Speciation Methods, Wiley-VCH Verlag, pp.83-116, 2016, 9783527694907 (ISBN); 9783527339693 (ISBN). ⟨hal-01529884⟩
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