Skip to Main content Skip to Navigation
Journal articles

Electronic structure investigation of biphenylene films

Abstract : Photoelectron Spectroscopy (PS) and Near-Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy have been used to investigate the occupied and empty density of states of biphenylene films of different thicknesses, deposited onto a Cu(111) crystal. The obtained results have been compared to previous gas phase spectra and single molecule Density Functional Theory (DFT) calculations to get insights into the possible modification of the molecular electronic structure in the film induced by the adsorption on a surface. Furthermore, NEXAFS measurements allowed characterizing the variation of the molecular arrangement with the film thickness and helped to clarify the substrate-molecule interaction.
Document type :
Journal articles
Complete list of metadatas

Cited literature [29 references]  Display  Hide  Download

https://hal.sorbonne-universite.fr/hal-01512755
Contributor : Gestionnaire Hal-Upmc <>
Submitted on : Monday, April 24, 2017 - 12:31:34 PM
Last modification on : Monday, October 19, 2020 - 8:26:03 PM
Long-term archiving on: : Tuesday, July 25, 2017 - 3:42:52 PM

File

1.4975104.pdf
Publisher files allowed on an open archive

Identifiers

Citation

R. Totani, C. Grazioli, T. Zhang, I. Bidermane, J. Lüder, et al.. Electronic structure investigation of biphenylene films. Journal of Chemical Physics, American Institute of Physics, 2017, 146 (5), pp.054705. ⟨10.1063/1.4975104⟩. ⟨hal-01512755⟩

Share

Metrics

Record views

559

Files downloads

261