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Mechanical strain induced changes in electrical characteristics of flexible, non-volatile ferroelectric OFET based memory

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https://hal.archives-ouvertes.fr/hal-01500136
Contributor : Isabelle Dufour <>
Submitted on : Sunday, April 2, 2017 - 4:43:39 PM
Last modification on : Wednesday, March 11, 2020 - 4:46:25 PM

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Damien Thuau, Mamatimin Abbas, Guillaume Wantz, Lionel Hirsch, Isabelle Dufour, et al.. Mechanical strain induced changes in electrical characteristics of flexible, non-volatile ferroelectric OFET based memory. Organic Electronics, Elsevier, 2017, 40 (1), pp.30-35. ⟨10.1016/j.orgel.2016.10.036⟩. ⟨hal-01500136⟩

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