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Study of workload impact on BTI HCI induced aging of digital circuits

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https://hal.archives-ouvertes.fr/hal-01474800
Contributor : Lucie Torella <>
Submitted on : Thursday, February 23, 2017 - 10:53:27 AM
Last modification on : Tuesday, May 11, 2021 - 11:37:51 AM

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Distributed under a Creative Commons Attribution - NonCommercial 4.0 International License

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  • HAL Id : hal-01474800, version 1

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CNRS | TIMA | UGA

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A. Sivadasan, F. Cacho, A. Benhassain, V. Huard, Lorena Anghel. Study of workload impact on BTI HCI induced aging of digital circuits. Design Automation and Test in Europe (DATE'16), Mar 2016, Dresden, Germany. ⟨hal-01474800⟩

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