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Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis

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https://hal.archives-ouvertes.fr/hal-01474799
Contributor : Lucie Torella <>
Submitted on : Thursday, February 23, 2017 - 10:52:43 AM
Last modification on : Tuesday, May 11, 2021 - 11:37:51 AM

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Distributed under a Creative Commons Attribution - NonCommercial 4.0 International License

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  • HAL Id : hal-01474799, version 1

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A. Sivadasan, F. Cacho, A. Benhassain, V. Huard, Lorena Anghel. Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Mar 2016, Dresden, Germany. ⟨hal-01474799⟩

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