Ballistic Electron Emission Microscopy (BEEM): a local and quantitative probe to study the quality of Au/hexadecanethiols/GaAs(001) heterostructures by imaging buried interfaces and drawing local energy band alignments

Alexandra Junay (1) , Sophie Guézo (1) , Pascal Turban (1) , Bruno Lépine (1) , Gabriel Delhaye (1) , Sylvain Tricot (1) , Soraya Ababou-Girard (1) , F. Solal (1)

1 IPR - Institut de Physique de Rennes

Mots clés: propriétés électronique; transport; champ proche; BEEM; hétéostructures organique-inorganique

Domaines: Physique [physics]

Alexandra Junay, Sophie Guézo, Pascal Turban, Bruno Lépine, Gabriel Delhaye, et al.. Ballistic Electron Emission Microscopy (BEEM): a local and quantitative probe to study the quality of Au/hexadecanethiols/GaAs(001) heterostructures by imaging buried interfaces and drawing local energy band alignments. Journées Surfaces et Interfaces 2016, CINAM, Jan 2016, Marseille, France. ⟨hal-01470510⟩