Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview, Microelectronics Reliability, vol.51, issue.9-11, pp.1440-1448, 2011. ,
DOI : 10.1016/j.microrel.2011.06.061
Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits, IBM journal of research and development, pp.162-172, 1990. ,
DOI : 10.1147/rd.342.0162
Fundamentals and future applications of Laser Voltage Probing, 2014 IEEE International Reliability Physics Symposium, pp.162-172, 2014. ,
DOI : 10.1109/IRPS.2014.6860635
Method and means for optical detection of charge density modulation in a semiconductor, American patent application : US 4758092 A, 1986. ,
Réflectométrie et interférométrie laser haute résolution. ApplicationàApplicationà la caractérisation de composantsélectroniques composantsélectroniques ,
Optical probing of flip chip packaged microprocessors, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol.16, issue.6, pp.162-172, 1990. ,
DOI : 10.1116/1.590316
Measurement of real-time digital signals in a silicon bipolar junction transistor using a noninvasive optical probe, Electronics Letters, vol.22, issue.12, pp.650-652, 1986. ,
DOI : 10.1049/el:19860445
Introduction to Laser Voltage Probing (LVP) of Integrated Circuits " , Microelectronics Failure Analysis, pp.349-353, 2011. ,
Electro-optical Effects in Silicones, IEEE, issue.23, p.123, 1987. ,
Optical probing (EOFM / TRI): A large set of complementary applications for ultimate VLSI, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.119-126, 2013. ,
DOI : 10.1109/IPFA.2013.6599138
URL : https://hal.archives-ouvertes.fr/hal-00860858
Fast 3D electro-optical frequency mapping and probing in frequency domain, 2016 IEEE International Reliability Physics Symposium (IRPS), 2016. ,
DOI : 10.1109/IRPS.2016.7574612
Systems and methods for laser voltage imaging, American patent application : US 20160109513, 2016. ,
Highly accelerated simulations of glassy dynamics using GPUs: Caveats on limited floating-point precision, Computer Physics Communications, vol.182, issue.5, pp.1120-1129, 2011. ,
DOI : 10.1016/j.cpc.2011.01.009
Frequency mapping in dynamic light emission with wavelet transform, Microelectronics Reliability, vol.53, issue.9-11, pp.1387-1392, 2013. ,
DOI : 10.1016/j.microrel.2013.07.024
URL : https://hal.archives-ouvertes.fr/hal-00874178
Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering, Microelectronics Reliability, vol.55, issue.9-10, pp.1585-1591, 2015. ,
DOI : 10.1016/j.microrel.2015.06.100
URL : https://hal.archives-ouvertes.fr/hal-01205617
A comparative performance study of several pitch detection algorithms, IEEE Transactions on Acoustics, Speech, and Signal Processing, vol.24, issue.5, pp.399-418, 1976. ,
DOI : 10.1109/TASSP.1976.1162846